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Proceedings Paper

Influence of confined layer on characteristics of current density and carrier diffusion in VCSEL
Author(s): XiaoFeng Duan; Chu Zhang; Bing Zhou; Chunmei Xu
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Paper Details

Date Published: 5 September 2002
PDF: 5 pages
Proc. SPIE 4913, Semiconductor Lasers and Applications, (5 September 2002); doi: 10.1117/12.482230
Show Author Affiliations
XiaoFeng Duan, Ordnance Engineering College (China)
Chu Zhang, Ordnance Engineering College (China)
Bing Zhou, Ordnance Engineering College (China)
Chunmei Xu, Ordnance Engineering College (China)

Published in SPIE Proceedings Vol. 4913:
Semiconductor Lasers and Applications
Yi Luo; Yoshiaki Nakano, Editor(s)

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