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Proceedings Paper

Optimum designs of 30-km distributed optical fiber Raman photon temperature sensors and measurement network
Author(s): Zaixuan Zhang; Honglin Liu; Ning Guo; Jianfeng Wang; Xiaobiao Wu; Xiangdong Yu; Haiqi Feng; Insoo S. Kim
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Paper Abstract

The distributed optical fiber Raman Photons Temperature Sensors (DFRS) is a real time, on line and multi-point (30k points) measuring system for multi-parameter measurement of temperature etc. According to temperature effect of optical fiber Raman backscattering, the intensity of anti-stokes Raman backscattering of optical fiber is modulated by the spatial temperature field where the optical fiber is laid. Then after signal processing and demodulation, the information of temperature can be extracted from the noise and can be displayed in real time. It is a typical optical fiber sensors measuring network. In time domain, using the velocity of light wave in optical fiber, the time interval of back-direction light wave and optical fiber OTDR technology, the DFRS can locate the temperature spots. In this case, it is a typical optical fiber laser temperature radar system as well. The backscattering spectrum of optical fiber has been measured by fiber laser and optical spectrum analyzer. Raman backscattering spectrum and ZX band backscattering spectrum has been first observed. The amplification of anti-stokes Raman spontaneous scattering (ARS) and the temperature effect have been first observed and applied to DFRS. The performance of DOFS is following: fiber length : 25.2km;temperature measuring range: 0-1000C(can be expand) temperature uncertainty: ±200C : temperature resolution: 0. 1; spatial resolution: 5m: measurement time: 10mm; Main unit operation temperature range: 0—400C . The optical fiber sensor probes and the software for signal processing are also discussed.

Paper Details

Date Published: 9 September 2002
PDF: 6 pages
Proc. SPIE 4920, Advanced Sensor Systems and Applications, (9 September 2002); doi: 10.1117/12.481983
Show Author Affiliations
Zaixuan Zhang, China Institute of Metrology (China)
Honglin Liu, China Institute of Metrology (China)
Ning Guo, China Institute of Metrology (China)
Jianfeng Wang, China Institute of Metrology (China)
Xiaobiao Wu, China Institute of Metrology (China)
Xiangdong Yu, China Institute of Metrology (China)
Haiqi Feng, China Institute of Metrology (China)
Insoo S. Kim, Korea Electrotechnology Research Institute (South Korea)


Published in SPIE Proceedings Vol. 4920:
Advanced Sensor Systems and Applications
Yun-Jiang Rao; Julian D. C. Jones; Hiroshi Naruse; Robert I. Chen, Editor(s)

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