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Proceedings Paper

Thermoelectric voltage in slant-angle-deposited metallic films
Author(s): I. I. Verechshagin; Ya. A. Oksman
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Paper Abstract

The thermoelectric voltage induced in the slant-angle deposited metallic films by light has been investigated. It is found that the magnitude of this voltage depends on the surface morphology and the width of the films. The physical models of this phenomenon discussed in the present work permit choosing of the optimum geometry of the film layer in manufacturing non-selective detectors of radiation.

Paper Details

Date Published: 1 December 1991
PDF: 5 pages
Proc. SPIE 1440, Optical Radiation Interaction with Matter, (1 December 1991); doi: 10.1117/12.48177
Show Author Affiliations
I. I. Verechshagin, S.I. Vavilov State Optical Institute (Russia)
Ya. A. Oksman, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 1440:
Optical Radiation Interaction with Matter

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