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Proceedings Paper

New-style defect inspection system of film
Author(s): Yan Liang; Wenyao Liu; Ming Liu; Ronggang Lee
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Paper Abstract

An inspection system has been developed for on-line detection of film defects, which bases on combination of photoelectric imaging and digital image processing. The system runs in high speed of maximum 60m/min. Moving film is illuminated by LED array which emits even infrared (peak wavelength λp=940nm), and infrared images are obtained with a high quality and high speed CCD camera. The application software based on Visual C++6.0 under Windows processes images in real time by means of such algorithms as median filter, edge detection and projection, etc. The system is made up of four modules, which are introduced in detail in the paper. On-line experiment results shows that the inspection system can recognize defects precisely in high speed and run reliably in practical application.

Paper Details

Date Published: 5 September 2002
PDF: 8 pages
Proc. SPIE 4921, Optical Manufacturing Technologies, (5 September 2002); doi: 10.1117/12.481736
Show Author Affiliations
Yan Liang, Tianjin Univ. (China)
Wenyao Liu, Tianjin Univ. (China)
Ming Liu, Tianjin Univ. (China)
Ronggang Lee, North China Research Institute of Electro-optics (China)


Published in SPIE Proceedings Vol. 4921:
Optical Manufacturing Technologies
Yimo Zhang; Wenyao Liu; Harvey M. Pollicove, Editor(s)

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