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Proceedings Paper

Application of micro-interferometrics in fiber end surface analysis
Author(s): Zhaohui Li; Wencai Jing; Yimo Zhang; Ge Zhou; Hongxia Zhang; Haifeng Li; Xiaoming Man
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Paper Abstract

A noncontact system for detecting and monitoring the grain and contour of optical connector end face based on Mirau-type interferometer is proposed in this paper. In this system, phase shift technique has been adopted. A five steps algorithm is presented. By this algorithm, the computer can analyze the interference pattern and unwrapped the phase information of the detected surface. Then we can get the differential height of every point on the surface. This method is capable of measuring fiber height to ±0.003 microns and radius of curvature and offset of polish to ±0.30 mm and ±2.0 microns respectively. So we can get not only 2-D and 3-D topography of testing surface, but also the evaluation parameters of surface roughness.

Paper Details

Date Published: 5 September 2002
PDF: 5 pages
Proc. SPIE 4921, Optical Manufacturing Technologies, (5 September 2002); doi: 10.1117/12.481735
Show Author Affiliations
Zhaohui Li, Tianjin Univ. (China)
Wencai Jing, Tianjin Univ. (China)
Yimo Zhang, Tianjin Univ. (China)
Ge Zhou, Tianjin Univ. (China)
Hongxia Zhang, Tianjin Univ. (China)
Haifeng Li, Tianjin Univ. (China)
Xiaoming Man, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 4921:
Optical Manufacturing Technologies
Yimo Zhang; Wenyao Liu; Harvey M. Pollicove, Editor(s)

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