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Proceedings Paper

Phase-shift interferometry surface plasmon microscopy
Author(s): Jun Guo; Wei Wei; Jihua Guo
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Paper Abstract

A novel optical imaging method that makes use of surface plasmon microscopy (SPM) and phase shift interferometry is developed. It is named phase shift interferometry-surface plasmon microscopy (PSI-SPM). In comparison with SPM, it can measure not only the intensity of the light reflected under SPR conditions, but also the phase of the light. The images of higher resolution (compared with SPM) can be obtained through the synthesis of the phase (color) and intensity (brightness) information.

Paper Details

Date Published: 5 September 2002
PDF: 5 pages
Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); doi: 10.1117/12.481729
Show Author Affiliations
Jun Guo, Tsinghua Univ. (China)
Wei Wei, Tsinghua Univ. (China)
Jihua Guo, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 4923:
Nano-Optics and Nano-Structures
Xing Zhu; Stephen Y. Chou; Yasuhiko Arakawa, Editor(s)

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