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Proceedings Paper

Measurements of photoconductive switches with an ultrafast scanning tunneling microscope
Author(s): Tian Lan; GuoQiang Ni
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Paper Details

Date Published: 5 September 2002
PDF: 5 pages
Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); doi: 10.1117/12.481714
Show Author Affiliations
Tian Lan, Beijing Institute of Technology (China)
GuoQiang Ni, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 4923:
Nano-Optics and Nano-Structures
Xing Zhu; Stephen Y. Chou; Yasuhiko Arakawa, Editor(s)

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