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Proceedings Paper

Tailored particle distributions derived from MIL-STD-1246
Author(s): Ronald V. Peterson; Philip G. Magallanes; David F. Rock
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Paper Abstract

The use of MIL-STD-1246 particle distributions for calculating BRDF scatter has given unrealistic cleanliness requirements for optical systems exposed to environmental fallout. MIL-STD-1246 and fallout data were reviewed and used to generate more realistic particle distributions for use in BRDF scatter predictions.

Paper Details

Date Published: 11 September 2002
PDF: 20 pages
Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); doi: 10.1117/12.481665
Show Author Affiliations
Ronald V. Peterson, Raytheon Co. (United States)
Philip G. Magallanes, Raytheon Co. (United States)
David F. Rock, Raytheon Co. (United States)

Published in SPIE Proceedings Vol. 4774:
Optical System Contamination: Effects, Measurements, and Control VII
Philip T. C. Chen; O. Manuel Uy, Editor(s)

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