Share Email Print
cover

Proceedings Paper

Cleanliness validation of NIF small optics
Author(s): Robert Chow; Robert C. Bickel; John Ertel; James Pryatel; Gary E. Loomis; Irving F. Stowers; John R. Taylor
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The National Ignition Facility will be the highest energy laser in the world when completed. Many small optics (less than or equal to 14" in diameter) have stringent transport efficiency and some have very high laser fluence requirements. For optics to sustain high spectral efficiencies and survive high fluences for a 30-year operation, these optics have cleanliness requirements to assure optimal laser system performance. These optical components have insufficient surface areas to validate the particulate and organic contamination requirements by methods used for mechanical parts. Also, the common validation techniques require some sort of surface contact which is not compatible with handling of laser optics. This presentation describes alternate cleanliness validation methods developed for the NIF small optical components. An organic validation procedure was devised based on the spectral transmission sensitivity to contamination layers on coated and uncoated fused silica windows. Optics were scanned in the near infrared before and after an application of a specific amount of organic contamination onto the surface. Changes in transmission correlated to organic contamination levels and used to determine non-volatile organic contamination optics. A validation method for particulate contamination was demonstrated on a large window, showing that acceptable cleanliness levels could be achieved after a wet-wipe and inspection with a high intensity light. The method is similar to that used to inspect the surface quality of optical components.

Paper Details

Date Published: 11 September 2002
PDF: 10 pages
Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); doi: 10.1117/12.481661
Show Author Affiliations
Robert Chow, Lawrence Livermore National Lab. (United States)
Robert C. Bickel, Lawrence Livermore National Lab. (United States)
John Ertel, Lawrence Livermore National Lab. (United States)
James Pryatel, Lawrence Livermore National Lab. (United States)
Gary E. Loomis, Lawrence Livermore National Lab. (United States)
Irving F. Stowers, Lawrence Livermore National Lab. (United States)
John R. Taylor, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 4774:
Optical System Contamination: Effects, Measurements, and Control VII
Philip T. C. Chen; O. Manuel Uy, Editor(s)

© SPIE. Terms of Use
Back to Top