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Proceedings Paper

Analysis of semi-volatile residues using diffuse reflectance infrared Fourier transform spectroscopy
Author(s): James J. Herrick; James S. Dyer; Adrian R. Guy; Cynthia K. Lee; David M. Soules; Mark S. Anderson
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Paper Abstract

Semi-volatile residues on aerospace hardware can be analyzed using Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFTS). This method can be correlated with quantitative Mil-STD 1246 NVR measurements while simultaneously providing qualitative identification of a large variety of compounds. Its high sensitivity supports the direct sampling of small areas of critical surfaces. This method involves transferring the contaminant film to a small solvent-saturated wipe, followed by extraction of the wipe, then concentration of the solvent extract and subsequent spectroscopic analysis using an FT-IR with a diffuse reflectance accessory. A library of standard curves for different classes of typical aerospace contaminants has been established. Quantitative analysis has been proven successful over orders of magnitude and detection limits exceeding 0.1 ug/cm2 are routinely achieved. Several practical applications have been performed using this analytical method and detailed discussion of analysis techniques is presented. The discussion will include: instrumentation setup, selection and preparation of sample collection materials, sample extract preparation, preparation of standard calibration curves and spectral interpretation.

Paper Details

Date Published: 11 September 2002
PDF: 11 pages
Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); doi: 10.1117/12.481658
Show Author Affiliations
James J. Herrick, Utah State Univ. Research Foundation (United States)
James S. Dyer, Utah State Univ. Research Foundation (United States)
Adrian R. Guy, Utah State Univ. Research Foundation (United States)
Cynthia K. Lee, Colorado State Univ. (United States)
David M. Soules, Jet Propulsion Lab. (United States)
Mark S. Anderson, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 4774:
Optical System Contamination: Effects, Measurements, and Control VII
Philip T. C. Chen; O. Manuel Uy, Editor(s)

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