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Proceedings Paper

Nonlinear analysis on diffraction properties of volume hologram
Author(s): Jing Zhou; Dahe Liu; Kun Ren
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Paper Abstract

The nonlinear refractive index model is used to analyze the diffraction properties of reflection volume hologram. Using characteristic matrix method of multi-layer system, we analyzed the wavelength selectivity and angular selectivity of the diffraction efficiency of reflection volume hologram for P and S polarization. Compared to the classic pure sinusoidal index modulation, this nonlinear model gave more practical results.

Paper Details

Date Published: 30 August 2002
PDF: 5 pages
Proc. SPIE 4924, Holography, Diffractive Optics, and Applications, (30 August 2002); doi: 10.1117/12.481491
Show Author Affiliations
Jing Zhou, Beijing Normal Univ. (China)
Dahe Liu, Beijing Normal Univ. (China)
Kun Ren, Beijing Normal Univ. (China)

Published in SPIE Proceedings Vol. 4924:
Holography, Diffractive Optics, and Applications
Dahsiung Hsu; Jiabi Chen; Yunlong Sheng, Editor(s)

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