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Proceedings Paper

Integrating computational models with experimental data in reliability
Author(s): Michael J. LuValle; Janet L. Mrotek; Leon R. Copeland; Gair D. Brown; Bruce G. LeFevre; Robert Throm
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Paper Abstract

In this paper we define what we consider the current defacto paradigm for accelerated testing, discuss what is wrong with it, introduce a more rigorous paradigm, and develop some theory for the new paradigm. Examples used for illustration include modeling degradation of connectors under cyclic stress, modeling degradation of metal films, and a pure Arrhenious thermal model of failure.

Paper Details

Date Published: 25 June 2002
PDF: 12 pages
Proc. SPIE 4639, Optical Fiber and Fiber Component Mechanical Reliability and Testing II, (25 June 2002); doi: 10.1117/12.481326
Show Author Affiliations
Michael J. LuValle, OFS-Fitel (United States)
Janet L. Mrotek, OFS-Fitel (United States)
Leon R. Copeland, OFS-Fitel (United States)
Gair D. Brown, Naval Surface Warfare Ctr. (United States)
Bruce G. LeFevre, OFS-Fitel (United States)
Robert Throm, Naval Surface Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 4639:
Optical Fiber and Fiber Component Mechanical Reliability and Testing II
M. John Matthewson; Charles R. Kurkjian, Editor(s)

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