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Proceedings Paper

Electrochromic paper-quality displays
Author(s): Colm McAtamney; Francois Pichot; Aoife O'Flaherty; Nigel Leyland; S. N. Rao; Niall Stobie; Mark Kinsella; David Corr; Udo Bach
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Paper Abstract

In this paper we give an overview on NTera's novel reflective display technology with real 'ink-on-paper' readability. Our technology is based on mesoporous wide-bandgap semiconductor films modified with self-assembled monolayers of electrochromic chromophores. The direct vicinity of each electrochromophore to the semiconductor allows its electronic addressing in the millisecond domain. The high molar extinction coefficient of the organic chromophores in conjunction with the extremely large specific surface area of the mesoporous semiconductor substrate allows to achieve deep colorations with high contrast ratios. Combined with a unique white reflector technology yielding reflectivities above 50 percent and excellent angular contrast independnece, oru displays show outstanding optical properties, comparable to those of ink on paper. Applying simple printing techniques these displays can be manufactured from commercially available nanomaterials like TiO2 or other doped or undoped metal oxides. Along with favorable electronic properties like low power consumption and excellent open-circuit memory electrochromic displays seriously rival conventional LCD display applications.

Paper Details

Date Published: 27 August 2003
PDF: 10 pages
Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); doi: 10.1117/12.481096
Show Author Affiliations
Colm McAtamney, NTera Ltd. (Ireland)
Francois Pichot, NTera Ltd. (Ireland)
Aoife O'Flaherty, NTera Ltd. (Ireland)
Nigel Leyland, NTera Ltd. (Ireland)
S. N. Rao, NTera Ltd. (Ireland)
Niall Stobie, NTera Ltd. (Ireland)
Mark Kinsella, NTera Ltd. (Ireland)
David Corr, NTera Ltd. (Ireland)
Udo Bach, NTera Ltd. (Ireland)

Published in SPIE Proceedings Vol. 4876:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Vincent Toal; Norman Douglas McMillan; Gerard M. O'Connor; Eon O'Mongain; Austin F. Duke; John F. Donegan; James A. McLaughlin; Brian D. MacCraith; Werner J. Blau, Editor(s)

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