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Proceedings Paper

Loss measurement of oxidized porous silicon optical waveguides by nondestructive end-fire coupling
Author(s): Zhenhong Jia
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Paper Abstract

The oxidised porous silicon channel waveguides were fabricated by controlling the illumination intensities and anodisation time during anodisation process is reported in this paper. By the technique combined the optimisation end-fire coupling and cut-back methods, the relatively exact results of measured propagation loss, endface' s scattering loss and the mode mismatching loss of oxidised porous silicon channel waveguides were 12.5.2dB/cm, 4.6dB and 3.1dB respectively.

Paper Details

Date Published: 29 August 2002
PDF: 4 pages
Proc. SPIE 4905, Materials and Devices for Optical and Wireless Communications, (29 August 2002); doi: 10.1117/12.481045
Show Author Affiliations
Zhenhong Jia, Xinjiang Univ. (China)


Published in SPIE Proceedings Vol. 4905:
Materials and Devices for Optical and Wireless Communications
Constance J. Chang-Hasnain; YuXing Xia; Kenichi Iga, Editor(s)

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