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Proceedings Paper

Simulation of impulse responses for real indoor wireless IR communication channel
Author(s): Shanshan Zou; Haitao Zhang; Mali Gong; Ping Yan; Kai Zhang; Xin Yang; Wei Jin; Feng Jiang
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Paper Abstract

The impulse response of the wireless infrared communication channel determines performances of communication system, such as multipath penalty over the maximum baud rate and hidden-station situations. It is significant to correctly describe the impulse response of the working channel for design and performance evaluation of communication systems. In this paper, details of a simulation package that obtains impulse responses for arbitrary wireless infrared indoor channels are presented. Capability of estimating the effects of shapes of room or objects, surface reflection and transmission characteristics on impulse responses is the most important feature of this package. The common simulation models just consider empty cubic rectangular room, with surfaces assumed to be Lambertian reflection pattern. With several examples given in this paper, the conclusions can be drawn that the common simulations models are not adequate to describe the real complicated communication environment and not suitable to the requirement of accurate performance prediction for the communication systems. The results give a demonstration that the use of the common simulation models to approximate the real wireless channels can introduce several decibels in the evaluation of the path loss.

Paper Details

Date Published: 22 August 2002
PDF: 12 pages
Proc. SPIE 4911, Wireless and Mobile Communications II, (22 August 2002); doi: 10.1117/12.480496
Show Author Affiliations
Shanshan Zou, Tsinghua Univ. (China)
Haitao Zhang, Tsinghua Univ. (China)
Mali Gong, Tsinghua Univ. (China)
Ping Yan, Tsinghua Univ. (China)
Kai Zhang, Tsinghua Univ. (China)
Xin Yang, Tsinghua Univ. (China)
Wei Jin, Tsinghua Univ. (China)
Feng Jiang, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 4911:
Wireless and Mobile Communications II
Hequan Wu; Chih-Lin I; Jari Vaario, Editor(s)

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