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Proceedings Paper

Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processes
Author(s): Robert Chow; Michael D. Thomas; Robert C. Bickel; John R. Taylor
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Paper Abstract

When completed, the National Ignition Facility (NIF) will provide laser energies in the Mega-joule range. Successful pulse amplification to these extremely high levels requires that all small optics, found earlier in the beamline, have stringent surface and laser fluence requirements. In addition, they must operate reliably for 30 years constituting hundreds of thousands of shots. As part of the first four beamlines, spherical and aspherical lenses were required for the beam relaying telescopes. The magneto-rheological technique allows for faster and more accurate finishing of aspheres. The spherical and aspherical lenses were final figured using both coventional-pitch polishing processes for high quality laser optics and the magneto-rheological finishing process. The purpose of this paper is to compare the surface properties between these two finishing processes. Some lenses were set aside from production for evaluation. The surface roughness in the mid-frequency range was measured and the scatter was studied. Laser damage testing at 1064 nm (3-ns pulse width) was performed on surfaces in both the uncoated and coated condition.

Paper Details

Date Published: 30 May 2003
PDF: 7 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.480213
Show Author Affiliations
Robert Chow, Lawrence Livermore National Lab. (United States)
Michael D. Thomas, Spica Technologies, Inc. (United States)
Robert C. Bickel, Lawrence Livermore National Lab. (United States)
John R. Taylor, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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