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Proceedings Paper

X-ray detection properties of polycrystalline Cd1-xZnxTe detectors for digital radiography
Author(s): Sang Sik Kang; Ji Koon Park; Dong Gil Lee; Chi Woong Mun; Jae Hyung Kim; Sang Hee Nam
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Paper Abstract

There has been considerable recent progress in II-IV semiconductor materials and in methods for improving performance of the associated digital x-ray detectors. Cd1-xZnxTe is known as promising medical x-ray detector material. The CdTe and Cd1-xZnxTe (x=0.15,0.25,0.3) detectors were fabricated by vacuum thermal evaporator for the large area deposition. First, the stoichimetric ratio and the x-ray diffraction of the deposited (Cd,Zn)Te films were analyzed by EPMA and XRD. Secondly, leakage current, x-ray sensitivity, SNR, and linearity were measured to analyze the x-ray detection effect of Zn in (Cd,Zn)Te film. Experimental results showed that the increase of Zn concentration rates in Cd1-xZnxTe detectors reduced the leakage current and improved the x-ray detection performance.

Paper Details

Date Published: 5 June 2003
PDF: 8 pages
Proc. SPIE 5030, Medical Imaging 2003: Physics of Medical Imaging, (5 June 2003); doi: 10.1117/12.480185
Show Author Affiliations
Sang Sik Kang, Inje Univ./Kimhae (South Korea)
Ji Koon Park, Inje Univ./Kimhae (South Korea)
Dong Gil Lee, Inje Univ./Kimhae (South Korea)
Chi Woong Mun, Inje Univ./Kimhae (South Korea)
Jae Hyung Kim, Inje Univ./Kimhae (South Korea)
Sang Hee Nam, Inje Univ./Kimhae (South Korea)

Published in SPIE Proceedings Vol. 5030:
Medical Imaging 2003: Physics of Medical Imaging
Martin J. Yaffe; Larry E. Antonuk, Editor(s)

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