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Proceedings Paper

Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface
Author(s): Semyon Papernov; Ansgar W. Schmid
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Paper Abstract

The impact of absorbing defect location inside thin film on measured laser-damage threshold and morphology is explored, using gold nanoparticles as artificial thin-film defects. In this work, 351-nm, 0.5-ns laser pulses were used to produce damage in SiO2 thin film containing gold nanoparticles located at predetermined but different distances from the film surface. As a result, laser-induced damage thresholds detected by means of dark-field optical microscopy and atomic force microscopy are measured and comparative trends are analyzed. Damage-crater geometry variations with particle-lodging depth are also obtained and compared with theoretical predictions.

Paper Details

Date Published: 30 May 2003
PDF: 9 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.480065
Show Author Affiliations
Semyon Papernov, Univ. of Rochester (United States)
Ansgar W. Schmid, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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