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Proceedings Paper

Examples of the topographies of the wavefront-variance merit function at different aberration orders
Author(s): Steve C. Johnston
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Paper Abstract

The wavefront variance merit function is constructed with aberration orders identified and partitioned. The partitioned merit function topographies of three optical systems are examined. 1. INTRODUCFION The study of the behavior of individual wavefront aberration coefficients with respect to optical system parameters has long been successfully employed to gain insight into the properties of optical systems. However for many optical systems it is more appropriate to examine the wavefront aberrations collectively rather than individually. New insight into the imaging characteristics of optical systems may be obtained by using the individual wavefront aberration coefficients to construct the average wavefront variance function. This can be done in such a way that the merit function may be separated into partitions which are associated with a single aberration order. The partitions are a small number of image quality indicators that may be examined individually. Each indicator ifiustrates the behavior of the optical system at a particular aberration order. 2. FORMULATION OF THE MERIT FUNCTION The wavefront variance merit function is defined by K w2 )ftuld '' (1) where the angle brackets denote averaging over the pupil or field as indicated in the equation and W is the wavefront aberration function as a function of pupil position p. and field position H. For axially symmetric optical systems the aberration coefficients are introduced by writing the wavefront aberration function as a Taylor series expansion in p and

Paper Details

Date Published: 1 January 1991
PDF: 6 pages
Proc. SPIE 1354, 1990 Intl Lens Design Conf, (1 January 1991); doi: 10.1117/12.47914
Show Author Affiliations
Steve C. Johnston, Breault Research Organization (United States)


Published in SPIE Proceedings Vol. 1354:
1990 Intl Lens Design Conf
George N. Lawrence, Editor(s)

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