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Proceedings Paper

Indium gallium arsenide imaging with smaller cameras, higher-resolution arrays, and greater material sensitivity
Author(s): Martin H. Ettenberg; Marshall J. Cohen; Robert M. Brubaker; Michael J. Lange; Matthew T. O'Grady; Gregory H. Olsen
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Paper Abstract

Indium Gallium Arsenide (InGaAs) photodiode arrays have numerous commercial, industrial, and military applications. During the past 10 years, great strides have been made in the development of these devices starting with simple 256-element linear photodiode arrays and progressing to the large 640 x 512 element area arrays now readily available. Linear arrays are offered with 512 elements on a 25 micron pitch with no defective pixels, and are used in spectroscopic monitors for wavelength division multiplexing (WDM) systems as well as in machine vision applications. A 320 x 240 solid-state array operates at room temperature, which allows development of a camera which is smaller than 25 cm3 in volume, weighs less than 100 g and uses less than 750 mW of power. Two dimensional focal plane arrays and cameras have been manufactured with detectivity, D*, greater than 1014 cm-(root)Hz/W at room temperature and have demonstrated the ability to image at night. Cameras are also critical tools for the assembly and performance monitoring of optical switches and add-drop multiplexers in the telecommunications industry. These same cameras are used for the inspection of silicon wafers and fine art, laser beam profiling, and metals manufacturing. By varying the Indium content, InGaAs photodiode arrays can be tailored to cover the entire short-wave infrared spectrum from 1.0 micron to 2.5 microns. InGaAs focal plane arrays and cameras sensitive to 2.0 micron wavelength light are now available in 320 x 240 formats.

Paper Details

Date Published: 5 August 2002
PDF: 11 pages
Proc. SPIE 4721, Infrared Detectors and Focal Plane Arrays VII, (5 August 2002); doi: 10.1117/12.478852
Show Author Affiliations
Martin H. Ettenberg, Sensors Unlimited, Inc. (United States)
Marshall J. Cohen, Sensors Unlimited, Inc. (United States)
Robert M. Brubaker, Sensors Unlimited, Inc. (United States)
Michael J. Lange, Sensors Unlimited, Inc. (United States)
Matthew T. O'Grady, Sensors Unlimited, Inc. (United States)
Gregory H. Olsen, Sensors Unlimited, Inc. (United States)


Published in SPIE Proceedings Vol. 4721:
Infrared Detectors and Focal Plane Arrays VII
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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