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Proceedings Paper

Stoichiometry issues in pulsed laser deposition of the ferromagnetic alloy NiMnSb
Author(s): Cristiana E. A. Grigorescu; O. Monnereau; Stefan A. Manea; R. Notonier; Agryro Klini; V. Zorba; Alexandra Manousaki; John Giapintzakis; Costas Fotakis
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Paper Abstract

We report on the reproducible growth of stoichiometric thin films of ferromagnetic intermetallic compound NiMnSb by pulsed laser deposition (PLD) on various substrates. The films are grown at moderate temperature (around 200 degree(s)C) using polycrystalline targets. Two different substrates were employed - single crystalline silicon and InAs polycrystalline - to investigate the influence of the thin layer/substrate lattice mismatch on the quality of the grown film. XRD and EDX analyses indicate that the layers are of high crystalline quality and their stoichiometry is very close to that of the corresponding targets, respectively. SEM images show that there are droplets on the surface of the films and their composition is similar to that of the targets. Magnetic measurements performed at both room temperature and 5K find that the investigated samples have small Hc values.

Paper Details

Date Published: 9 August 2002
PDF: 8 pages
Proc. SPIE 4762, ALT'01 International Conference on Advanced Laser Technologies, (9 August 2002); doi: 10.1117/12.478645
Show Author Affiliations
Cristiana E. A. Grigorescu, National Institute for Research and Development for Optoelectronics (Romania)
O. Monnereau, Univ. de Provence (France)
Stefan A. Manea, National Institute for Research and Development for Materials Physics (Romania)
R. Notonier
Agryro Klini, Foundation for Research and Technology-Hellas (Greece)
V. Zorba, Foundation for Research and Technology-Hellas (Greece)
Alexandra Manousaki, Foundation for Research and Technology-Hellas (Greece)
John Giapintzakis, Foundation for Research and Technology-Hellas (Greece)
Costas Fotakis, Foundation for Research and Technology-Hellas (Greece)


Published in SPIE Proceedings Vol. 4762:
ALT'01 International Conference on Advanced Laser Technologies

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