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Proceedings Paper

Determination of optical properties of PLZT thin films using transmittance spectra processing
Author(s): Tamara G. Pencheva; Milen Nenkov; Miroslav Jelinek; Jan Lancok; Jiri Bulir; Alexandr Deineka; Chao-Nan Xu
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Paper Abstract

This investigation deals with determination of optical parameters of thin PLZT films prepared by pulsed laser deposition on fused silica substrates at different oxygen pressure. Film composition and structure are investigated by WDX and XRD. Defects concentration in the films is studied using triboluminescence. Changes of film refractive index n((lambda) ), extinction k((lambda) ) with wavelength in the spectral region 0.3 - 1.1 micrometers and film thickness d are determined as a result of transmittance spectra processing. Waveguiding properties of the films are investigated.

Paper Details

Date Published: 9 August 2002
PDF: 5 pages
Proc. SPIE 4762, ALT'01 International Conference on Advanced Laser Technologies, (9 August 2002); doi: 10.1117/12.478633
Show Author Affiliations
Tamara G. Pencheva, Univ. of Rousse (Bulgaria)
Milen Nenkov, Univ. of Rousse (Bulgaria)
Miroslav Jelinek, Institute of Physics (Czech Republic)
Jan Lancok, Institute of Physics (Czech Republic)
Jiri Bulir, Institute of Physics (Czech Republic)
Alexandr Deineka, Institute of Physics (Czech Republic)
Chao-Nan Xu, Kyushu National Industrial Research Institute (Japan)

Published in SPIE Proceedings Vol. 4762:
ALT'01 International Conference on Advanced Laser Technologies

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