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Proceedings Paper

Burn-in test reduction for the Digital Micromirror Device (DMD)
Author(s): Timothy J. Hogan; Paul Barker; Michael R. Douglass
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Paper Abstract

Burn-in test has long been used in the semiconductor industry to screen out manufacturing defects. MEMS technologies, such as the DMD, can also use burn-in test to eliminate infant mortality failures. Burn-in test and test systems are among the most costly however, and it is always under review to shorten time or increase efficiency without reducing effectiveness. Detailed failure mode analysis from many thousands of device test logs resulted in the development of a novel application of an observed stress factor. Burn-in test time was reduced 55% on high volume DMD products with increased test efficiency and effectiveness.

Paper Details

Date Published: 16 January 2003
PDF: 7 pages
Proc. SPIE 4980, Reliability, Testing, and Characterization of MEMS/MOEMS II, (16 January 2003); doi: 10.1117/12.478211
Show Author Affiliations
Timothy J. Hogan, Texas Instruments Inc. (United States)
Paul Barker, Texas Instruments Inc. (United States)
Michael R. Douglass, Texas Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 4980:
Reliability, Testing, and Characterization of MEMS/MOEMS II
Rajeshuni Ramesham; Danelle M. Tanner, Editor(s)

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