Share Email Print
cover

Proceedings Paper

Investigation of hard magnetic silicone elastomer thin films
Author(s): Zhongmei Yao; Ji Fang; Jackie C. Chen; Weisong Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The hard magnetic materials with a high remnant magnetic moment, Mr, have the unique advantages that can achieve bi-directional (push-pull) movement in an external magnetic field. This paper presents the results on fabrication and testing of the novel hard magnetic silicone elastomer thin films. The micro-size hard ferrite powder, NdFeB powder and different silicone elastomers have been used to fabricate the various large elongation hard magnetic thin films. The uniform thin films range from 40 μm to 216 μm and they are successfully fabricated. Three different fabrication processing have been investigated and the mechanical properties, like Young’s modulus and deflection force, have been evaluated. The simulation results with ANSYS match the experimental data. In comparison to electrostatic or piezoelectric actuation, the magnetic actuation can provide stronger forces and larger deflections. The large elongation hard magnetic thin film provides an excellent diaphragm material, which plays an important role in the micro pump or valve. This film movement has been tested in the external magnetic field, and proved to have large deflections and high performances.

Paper Details

Date Published: 17 January 2003
PDF: 10 pages
Proc. SPIE 4982, Microfluidics, BioMEMS, and Medical Microsystems, (17 January 2003); doi: 10.1117/12.478159
Show Author Affiliations
Zhongmei Yao, Louisiana Tech Univ. (United States)
Ji Fang, Louisiana Tech Univ. (United States)
Jackie C. Chen, Louisiana Tech Univ. (United States)
Weisong Wang, Louisiana Tech Univ. (United States)


Published in SPIE Proceedings Vol. 4982:
Microfluidics, BioMEMS, and Medical Microsystems
Holger Becker; Peter Woias, Editor(s)

© SPIE. Terms of Use
Back to Top