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Proceedings Paper

Real-time optically sectioned wide-field microscopy employing structured light illumination and a CMOS detector
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Paper Abstract

Real-time optically sectioned microscopy is demonstrated using an AC-sensitive detection concept realized with smart CMOS image sensor and structured light illumination by a continuously moving periodic pattern. We describe two different detection systems based on CMOS image sensors for the detection and on-chip processing of the sectioned images in real time. A region-of-interest is sampled at high frame rate. The demodulated signal delivered by the detector corresponds to the depth discriminated image of the sample. The measured FWHM of the axial response depends on the spatial frequency of the projected grid illumination and is in the μm-range. The effect of using broadband incoherent illumination is discussed. The performance of these systems is demonstrated by imaging technical as well as biological samples.

Paper Details

Date Published: 9 July 2003
PDF: 9 pages
Proc. SPIE 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X, (9 July 2003); doi: 10.1117/12.478024
Show Author Affiliations
Jelena Mitic, Swiss Federal Institute of Technology Lausanne (Switzerland)
Tiemo Anhut, Swiss Federal Institute of Technology Lausanne (Switzerland)
Alexandre Serov, Swiss Federal Institute of Technology Lausanne (Switzerland)
Theo Lasser, Swiss Federal Institute of Technology Lausanne (Switzerland)
Stephane Bourquin, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4964:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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