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Proceedings Paper

High-resolution three-dimensional imaging using multiple nanometric probes
Author(s): Arnaud Dubois; Gael Moneron; Romain Lecaque; Francois Lequeux; Albert-Claude Boccara
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Paper Abstract

We present a new imaging modality using nanometric beads as multiple local probes. The positions of the beads are determined in three dimensions using white-light interference microscopy, by over-sampling and fitting the images. We measured the deformation of a Laponite gel with 100 nm resolution.

Paper Details

Date Published: 9 July 2003
PDF: 9 pages
Proc. SPIE 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X, (9 July 2003); doi: 10.1117/12.477973
Show Author Affiliations
Arnaud Dubois, Ecole Superieure de Physique et Chimie Industrielles (France)
Gael Moneron, Ecole Superieure de Physique et Chimie Industrielles (France)
Romain Lecaque, Ecole Superieure de Physique et Chimie Industrielles (France)
Francois Lequeux, Ecole Superieure de Physique et Chimie Industrielles (France)
Albert-Claude Boccara, Ecole Superieure de Physique et Chimie Industrielles (France)


Published in SPIE Proceedings Vol. 4964:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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