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Proceedings Paper

Veiling glare in the F4111 image intensifier
Author(s): Mukund Acharya; Robert M. Bunch
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Paper Abstract

Veiling glare is a phenomenon present in most imaging devices and systems. It is a source of concern in image intensifiers where it causes a loss in image contrast especially at low spatial frequencies. Veiling glare measurements are described for two different F4lll 18 mitt proximity focused channel intensifier tubes (image intensifiers) one with a fiber optic input window (FO/FO) and the other with a quartz input window (Q/FO) . Near field veiling glare a raeasure of the stray light close to an edge and far field veiling glare a measure of more widely distributed stray light were measured as fractions of the illumination level. Near field veiling glare of 0. 3 0. 06 and far field veiling glare of 0. 02 0. 004 was measured for the FO/FO intensifier and near field veiling glare of 0. 3 0. 06 and far field veiling glare of 0. 03 0. 004 was measured for the Q/FO intensifier. Characteristic lengths a measure of the extent of the veiling glare from the edge are 0. 7 0. 07 mm (near field) and 2. 0 0. 2 mm (far field) for the FO/FO intensifier and 1. 2 0. 1 mm (near field) and 7. 0 0. 7 mm (far field) for the Q/FO intensifier. Studies also show that characteristic lengths increase with increasing wavelength. Further a quasi-elastic electron scatter model suggested that electron scatter within

Paper Details

Date Published: 1 March 1991
PDF: 12 pages
Proc. SPIE 1396, Applications of Optical Engineering: Proceedings of OE/Midwest '90, (1 March 1991); doi: 10.1117/12.47765
Show Author Affiliations
Mukund Acharya, Rose-Hulman Institute of Technology (United States)
Robert M. Bunch, Rose-Hulman Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1396:
Applications of Optical Engineering: Proceedings of OE/Midwest '90
Rudolph P. Guzik; Hans E. Eppinger; Richard E. Gillespie; Mary Kathryn Dubiel; James E. Pearson, Editor(s)

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