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Proceedings Paper

Measurement of strains by means of electro-optics holography
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Paper Details

Date Published: 1 March 1991
PDF: 12 pages
Proc. SPIE 1396, Applications of Optical Engineering: Proceedings of OE/Midwest '90, (1 March 1991); doi: 10.1117/12.47753
Show Author Affiliations
Cesar A. Sciammarella, Illinois Institute of Technology (United States)
Gopalakrishna K. Bhat, Illinois Institute of Technology (United States)
Armando Albertazzi, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1396:
Applications of Optical Engineering: Proceedings of OE/Midwest '90

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