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Proceedings Paper

Tunnel profile measurement by vision metrology toward application to NATM
Author(s): Susumu Hattori; Keiichi Akimoto; Tetsu Ono; Satoru Miura
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Paper Abstract

The NATM, a widely used tunnel excavation method, requires precise periodical monitoring of deformations especially at fault zones, which tends to hamper traffics with conventional measurement means. In this paper vision metrology was applied to tunnel profile measurement with a view to developing a new method. Two hundred of Retro-targets are placed on a one-meter spacing lattice at a tunnel site of 7m in diameter and 15m in longitude, and 66 images were taken to cover the target field. The object space coordinates of targets obtained by bundle adjustment were compared with ones obtained by high-precision total station observation. The root mean square (RMS) of differences of coordinates was 0.548mm, which is precise enough for monitoring deformations for the NATM.

Paper Details

Date Published: 22 May 2003
PDF: 9 pages
Proc. SPIE 5011, Machine Vision Applications in Industrial Inspection XI, (22 May 2003); doi: 10.1117/12.477510
Show Author Affiliations
Susumu Hattori, Fukuyama Univ. (Japan)
Keiichi Akimoto, Shikoku Polytech College (Japan)
Tetsu Ono, Kyoto Univ. (Japan)
Satoru Miura, Kajima Technical Research Institute (Japan)

Published in SPIE Proceedings Vol. 5011:
Machine Vision Applications in Industrial Inspection XI
Martin A. Hunt; Jeffery R. Price, Editor(s)

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