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Proceedings Paper

Coherent length and holography
Author(s): Tung H. Jeong; Qiang Feng; Edward J. Wesly; Zhi-Min Qu
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Paper Abstract

The field of holography conipletely depends on the coherence of laser light. The most meaningful attribute of coherence for holographers is the coherent length. Commonly coherent length is regarded as the maxiinurct optical path difference between two bearas such as those in a Michelson interferorneter that results in a discernable interference pattern. Herein we discuss two direct holographic methods of measurements each yielding visually observable results. We begin by examining several theoretical models for laser spectral linewidths and their subsequent derivation of coherent lengths. 2. Spectroscopy and Line Shape Let us first discuss some basic tenants of laser spectroscopy since it leads us directly to the understanding of coherence. When the effects of the apparatus is progressively reduced and infinite resolving power is being used it is found that each spectral line consists of an intrinsic distribution of frequencies about the. line center. The profile of every spectral line has a finite width and characteristic shape which are determined by the conditions existing in the source and it is this profile which we now wish to consider. The line profile is important in determining many of the characteristics of gas lasers especially its coherence length. I. The Natural or Radiative Line Shape - the width of spectral lines errtitted by isolated stationary atoias. They are Lorentzian and honiogeneous. (i) Classical Model: Introducing the radiation reaction force it is easy to show

Paper Details

Date Published: 1 March 1991
PDF: 11 pages
Proc. SPIE 1396, Applications of Optical Engineering: Proceedings of OE/Midwest '90, (1 March 1991); doi: 10.1117/12.47739
Show Author Affiliations
Tung H. Jeong, Lake Forest College (United States)
Qiang Feng, Lake Forest College (United States)
Edward J. Wesly, Lake Forest College (United States)
Zhi-Min Qu, Lake Forest College (United States)


Published in SPIE Proceedings Vol. 1396:
Applications of Optical Engineering: Proceedings of OE/Midwest '90

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