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Proceedings Paper

Image processing utilizing an APL interface
Author(s): Carl Zmola; Oscar H. Kapp
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Paper Abstract

The past few years have seen the growing use of digital techniques in the analysis of electron microscope image data. This trend is driven by the need to maximize the information extracted from the electron micrograph by submitting its digital representation to the broad spectrum of analytical techniques made available by the digital computer. We are developing an image processing system for the analysis of digital images obtained with a scanning transmission electron microscope (STEM) and a scanning electron microscope (SEM). This system, run on an IBM PS/2 model 70/A21, uses menu-based image processing and an interactive APL interface which permits the direct manipulation of image data.

Paper Details

Date Published: 1 March 1991
PDF: 5 pages
Proc. SPIE 1396, Applications of Optical Engineering: Proceedings of OE/Midwest '90, (1 March 1991); doi: 10.1117/12.47737
Show Author Affiliations
Carl Zmola, Enrico Fermi Institute/Univ. of Chicago (United States)
Oscar H. Kapp, Enrico Fermi Institute/Univ. of Chicago (United States)


Published in SPIE Proceedings Vol. 1396:
Applications of Optical Engineering: Proceedings of OE/Midwest '90

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