Share Email Print
cover

Proceedings Paper

Bilinear interpolation centroid algorithm used for circular optical target location
Author(s): Zhi-jing YU; Chen Gang; Ren-sheng Che; Chang-ying Liu; Shu-ying MA; Wei TIAN
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the close digital photogrammetric three-dimension coordinates measurement, the circular target is often taken as imaging feature and mounted on the measured object or the probe for 3D coordinates detection. The accuracy with which circular targets are located determines the effectiveness of measurement. Subpixel level accuracy is one of the methods that can improve the accuracy of target location. Many methods which based on subpixel edge or centroid detection have been developed and analyzed for target location, but little research focused on circular optical target location. In this research, a new algorithm named bilinear interpolation centroid algorithm was developed for circular optical target subpixel location. In this technique, the accuracy of the squared gray weighted centroid algorithm can be improved by increasing the available pixels which obtained by bilinear interpolation. The intensity profile of the imaging points and the signal to noise ratio, which affect the subpixel location accuracy, are optimized by automatic exposure control. The experiments have shown that the accuracy of this algorithm is better than the traditional centroid algorithm, and the absolute error of less than 0.0 1 pixels is obtained on the image of a rigid reference bar.

Paper Details

Date Published: 31 July 2002
PDF: 7 pages
Proc. SPIE 4875, Second International Conference on Image and Graphics, (31 July 2002); doi: 10.1117/12.477162
Show Author Affiliations
Zhi-jing YU, Harbin Institute of Technology (China)
Chen Gang, Harbin Institute of Technology (China)
Ren-sheng Che, Harbin Institute of Technology (China)
Chang-ying Liu, Harbin Institute of Technology (China)
Shu-ying MA, Hebei Vocation-Technical Teachers College (China)
Wei TIAN, Hebei Vocation-Technical Teachers College (China)


Published in SPIE Proceedings Vol. 4875:
Second International Conference on Image and Graphics
Wei Sui, Editor(s)

© SPIE. Terms of Use
Back to Top