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Proceedings Paper

Design optimization of moire interferometers for rapid 3-D manufacturing inspection
Author(s): Steven Dubowsky; Krisztina J. Holly; Annie L. Murray; Joseph M. Wander
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Paper Abstract

While moire interferometry has been recognized as a promising technique for 3-D automated inspection it has not been widely used because designing a moire interferometer for a given inspection task can be difficult. Here mathematical models of the projection moire process are developed which permit the design of inspection systems. The resulting equations have been combined with numerical optimization techniques to yield software which optimizes a system for a given task. An application of the technique with experimental verification is presented.

Paper Details

Date Published: 1 March 1991
PDF: 11 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.47705
Show Author Affiliations
Steven Dubowsky, Massachusetts Institute of Technology (United States)
Krisztina J. Holly, Massachusetts Institute of Technology (United States)
Annie L. Murray, Massachusetts Institute of Technology (United States)
Joseph M. Wander, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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