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Proceedings Paper

Design optimization of moire interferometers for rapid 3-D manufacturing inspection
Author(s): Steven Dubowsky; Krisztina J. Holly; Annie L. Murray; Joseph M. Wander
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Paper Details

Date Published: 1 March 1991
PDF: 11 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.47705
Show Author Affiliations
Steven Dubowsky, Massachusetts Institute of Technology (United States)
Krisztina J. Holly, Massachusetts Institute of Technology (United States)
Annie L. Murray, Massachusetts Institute of Technology (United States)
Joseph M. Wander, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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