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Proceedings Paper

Nonlinear optical characterization of retinal molecules
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Paper Abstract

The measurements on the nonlinear absorption coefficient for the whole retina and separated molecular components have been determined using open-aperture z-scan. Our recent retinal damage studies have shown that the threshold for retinal damage decreases below one nanosecond exposure. Laser-induced breakdown has been implicated in the threshold-level mechanism for damage, and the threshold is reduced below 100 fs where LIB is the damage mechanism. Our hypothesis for this experiment is that non-linear optical properties of the constituents of the retina will affect the absorption coefficient of the retina for ultrashort pulse laser exposure and lower the retinal damage threshold for these exposures. This suggests that nonlinear absorption effects should be considered in the analysis of any data that relate energy deposition rates from laser exposures in tissue to thermal or photomechanical damage mechanisms that explain cell death. We describe the impact of these measurements on retinal damage thresholds and damage mechanisms for various pulse regimes.

Paper Details

Date Published: 20 June 2003
PDF: 6 pages
Proc. SPIE 4953, Laser and Noncoherent Light Ocular Effects: Epidemiology, Prevention, and Treatment III, (20 June 2003); doi: 10.1117/12.476886
Show Author Affiliations
Kristy L. Hayes, Air Force Research Lab. (United States)
Robert J. Thomas, Air Force Research Lab. (United States)
Jacob Stolarski, Air Force Research Lab. (United States)
Benjamin A. Rockwell, Air Force Research Lab. (United States)
David J. Stolarski, Northrop Grumman IT (United States)
Michael L. Denton, Northrop Grumman IT (United States)
Debbie M. Eikum, Northrop Grumman IT (United States)
Gary D. Noojin, Northrop Grumman IT (United States)
Randolph D. Glickman, Univ. of Texas Health Science Ctr. at San Antonio (United States)


Published in SPIE Proceedings Vol. 4953:
Laser and Noncoherent Light Ocular Effects: Epidemiology, Prevention, and Treatment III
Bruce E. Stuck; Michael Belkin, Editor(s)

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