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Proceedings Paper

Large-area interline CCD with low-dark current
Author(s): Christopher Parks; David L. Losee
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Paper Abstract

When interline CCD image sensors increase in size beyond 4 million pixels, CCD dark current begins to degrade the signal. Some scientific and photographic applications use very slow readout rates (less than 1 MHz) to reduce the noise level. At a 1-MHz readout rate, a 4-megapixel imager will take at least 4 s to read out. This extended time period allows a significant amount of dark current to build up and frustrate efforts to reduce noise. Often this situation leads to the additional expense of a low-temperature operation. The accumulation-mode readout method for interline CCD image sensors is being developed at Eastman Kodak Company. Previously, accumulation mode could only be applied to the full-frame architecture because the p-type substrate acted as a source for holes. Interline CCD image sensors with n-type substrates have no ready source of holes to accumulate the surface of the CCD under all phases. This problem has been overcome, allowing room-temperature operation without significant dark current generation.

Paper Details

Date Published: 16 May 2003
PDF: 9 pages
Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); doi: 10.1117/12.476796
Show Author Affiliations
Christopher Parks, Eastman Kodak Co. (United States)
David L. Losee, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 5017:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV
Nitin Sampat; Morley M. Blouke; Nitin Sampat; Ricardo J. Motta; Ricardo J. Motta, Editor(s)

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