Share Email Print
cover

Proceedings Paper

Simulation-based development and characterization of a CCD architecture for 1 million frames per second
Author(s): Dirk Poggemann; Arno Ruckelshausen; Takeharu Goji Etoh; Albert J. P. Theuwissen; Jan T. Bosiers; Hideki Mutoh; Yasushi Kondo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new high-speed CCD-sensor, capable of capturing 103 consecutive images at a speed of 1 million frames per second, was developed by the authors. To reach this high frame-rate, 103 CCD-storage-cells are placed next to each image-pixel. Sensors utilizing this on-chip-memory-concept can be called In-situ Storage Image Sensor or ISIS. The ISIS is build in standard CCD-technology. To check if this technology could be used for an ISIS, a test sensor called ISIS V1 was designed first. The ISIS V1 is just a simple modification of an existing standard CCD-sensor and it is capable of taking 17 consecutive images. The new sensor called ISIS V2 is a dedicated design in the existing technology. It is equipped with storage CCD-cells that are also used in the standard CCD-sensor, large light-sensitive pixels, an overwriting mechanism to drain old image information and a CCD-switch to use a part of the storage cells also as vertical read-out registers. Nevertheless, the new parts in the architecture had to be simulated by a 3-D device simulator. Simulation results and characteristic parameters of the ISIS-CCD as well as applications of the camera are given.

Paper Details

Date Published: 16 May 2003
PDF: 11 pages
Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); doi: 10.1117/12.476794
Show Author Affiliations
Dirk Poggemann, Univ. of Applied Sciences of Osnabrueck (Germany)
Arno Ruckelshausen, Univ. of Applied Sciences of Osnabrueck (Germany)
Takeharu Goji Etoh, Univ. of Applied Sciences of Osnabrueck (Germany)
Kinki Univ. (Japan)
Albert J. P. Theuwissen, DALSA BV (Netherlands)
Technische Univ. Delft (Netherlands)
Jan T. Bosiers, DALSA BV (Netherlands)
Hideki Mutoh, Link Research Corp. (Japan)
Yasushi Kondo, Shimadzu Corp. (Japan)


Published in SPIE Proceedings Vol. 5017:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV
Nitin Sampat; Ricardo J. Motta; Morley M. Blouke; Nitin Sampat; Ricardo J. Motta, Editor(s)

© SPIE. Terms of Use
Back to Top