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Proceedings Paper

Performance of an extended dynamic range, time delay integration charge coupled device (XDR TDI CCD) for high-intrascene dynamic range scanning
Author(s): Peter A. Levine; Robin M. Dawson; James T. Andrews; Mahalingham Bhaskaran; David Furst; Fu-Lung Hsueh; Grazyna M. Meray; Thomas M. Sudol; Pradyumna K. Swain; John R. Tower
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Paper Abstract

Many applications, such as industrial inspection and overhead reconnaissance benefit from line scanning architectures where time delay integration (TDI) significantly improves sensitivity. CCDs are particularly well suited to the TDI architecture since charge is transferred virtually noiselessly down the column. Sarnoff's TDI CCDs have demonstrated extremely high speeds where a 7200 x 64, 8 um pixel device with 120 output ports demonstrated a vertical line transfer rate greater than 800 kHz. The most recent addition to Sarnoff's TDI technology is the implementation of extended dynamic range (XDR) in high speed, back illuminated TDI CCDs. The optical, intrascene dynamic range can be adjusted in the design of the imager with measured dynamic ranges exceeding 2,000,000:1 with no degradation in low light performance. The device provides a piecewise linear response to light where multiple slopes and break points can be set during the CCD design. A description of the device architecture and measured results from fabricated XDR TDI CCDs are presented.

Paper Details

Date Published: 16 May 2003
PDF: 11 pages
Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); doi: 10.1117/12.476790
Show Author Affiliations
Peter A. Levine, Sarnoff Corp. (United States)
Robin M. Dawson, Sarnoff Corp. (United States)
James T. Andrews, Sarnoff Corp. (United States)
Mahalingham Bhaskaran, Sarnoff Corp. (United States)
David Furst, Sarnoff Corp. (United States)
Fu-Lung Hsueh, Sarnoff Corp. (United States)
Grazyna M. Meray, Sarnoff Corp. (United States)
Thomas M. Sudol, Sarnoff Corp. (United States)
Pradyumna K. Swain, Sarnoff Corp. (United States)
John R. Tower, Sarnoff Corp. (United States)

Published in SPIE Proceedings Vol. 5017:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV
Nitin Sampat; Morley M. Blouke; Nitin Sampat; Ricardo J. Motta; Ricardo J. Motta, Editor(s)

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