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Proceedings Paper

Color image acquisition method using color filter arrays occupying overlapped color spaces
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Paper Abstract

n existing single solid-state color image sensors, three primary color filter arrays are pasted on the surface of photo detectors according to the Bayeris pattern. To utilize information conveyed by the incoming light more efficiently, we can employ new color filters whose color components in their passband are overlapped with each other to a larger extent. As the filter array pattern we adopt the Bayeris pattern; but unlike the three primary color filters we use only two color filters, red and blue color filters, and we replace green pixels of the primary color filters with white-black pixels that correspond to pixels on which no light-absorption chemicals are pasted. In this scheme, the key point is to construct a demosaicking method suitable to these color filter arrays. We employ a hybrid demosaicking method that can restrain the occurrence of false color caused by the demosaicking and preserve original hue variations as thoroughly as possible while enhancing the spatial resolution of the restored image. The hybrid demosaicking method first applies the Landweber-type iterative algorithm, equipped with the frequency-band limitation corresponding to the sub-sampling pattern of the white-black pixel array, to the interpolation of white-black pixels, and then performs the interpolation of red and blue pixels with some existing chrominance-preserving-type method such as the gradient-based method. Experiments using test color images demonstrate that our hybrid demosaicking method reproduces a sharpened high-resolution color image without producing noticeable artifacts of false color. Our color image acquisition scheme gives a good compromise between false color occurrence and high-fidelity color reproduction.

Paper Details

Date Published: 16 May 2003
PDF: 12 pages
Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); doi: 10.1117/12.476743
Show Author Affiliations
Takashi Komatsu, Kanagawa Univ. (Japan)
Takahiro Saito, Kanagawa Univ. (Japan)


Published in SPIE Proceedings Vol. 5017:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV
Nitin Sampat; Ricardo J. Motta; Morley M. Blouke; Nitin Sampat; Ricardo J. Motta, Editor(s)

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