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Proceedings Paper

Silicon-on-insulator interferometric strain sensor
Author(s): Graham N. Pearson; Paul E. Jessop
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Paper Details

Date Published: 30 May 2003
PDF: 8 pages
Proc. SPIE 4997, Photonics Packaging and Integration III, (30 May 2003); doi: 10.1117/12.476663
Show Author Affiliations
Graham N. Pearson, McMaster Univ. (Canada)
Paul E. Jessop, McMaster Univ. (Canada)


Published in SPIE Proceedings Vol. 4997:
Photonics Packaging and Integration III
Randy A. Heyler; David J. Robbins; Ghassan E. Jabbour, Editor(s)

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