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Proceedings Paper

In vitro evaluation of smear layer removal of root canals by irradiation with Er:YAG laser after Ni-Ti rotary instrumentation
Author(s): Alexandre Capelli; Aldo Brugnera; Fabio Heredia Seixas; Melissa A. Marchesan; Danilo Mathias Zanello Guerisoli; Jesus Djalma Pecora
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Paper Abstract

The smear layer removal of root canal walls irradiated with Er:YAG laser after nickel-titanium rotary instrumentation was evaluated by scanning electron microscopy. Thirty mesial roots of human mandibular molars were selected and randomly distributed in three groups, according to treatment. Group 1 was instrumented with rotary nickel-titanium files 1 mm from the anatomical apex and irrigated with 2.5% sodium hypochlorite. Group 2 received the same treatment as Group 1, but after instrumentation the root canals were irradiated with Er:YAG laser. Group 3 received the same treatment as Group 1, but irrigation was performed with 2.5% sodium hypochlorite alternated wtih 17% EDTA during instrumentation. Photomicrographs were obtained from middle and apical thirds and submitted to qualitative evaluation. Statistical analysis showed that 2.5% sodium hypochlorite associated with 17% EDTA (Group 3) removed smear layer more efficiently than 2.5% sodium hypochlorite al one (Group 1) (p<0.05). Root canals irradiated with Er:YAG laser occupied an intermediary position regarding smear layer removal. There were no statistical differences between the evaluated radicular thirds (p>0.05).

Paper Details

Date Published: 3 July 2003
PDF: 7 pages
Proc. SPIE 4950, Lasers in Dentistry IX, (3 July 2003); doi: 10.1117/12.476638
Show Author Affiliations
Alexandre Capelli, Univ. de Sao Paulo (Brazil)
Aldo Brugnera, Univ. de Sao Paulo (Brazil)
Fabio Heredia Seixas, Univ. de Sao Paulo (Brazil)
Melissa A. Marchesan, Univ. de Sao Paulo (Brazil)
Danilo Mathias Zanello Guerisoli, Univ. de Sao Paulo (Brazil)
Jesus Djalma Pecora, Univ. de Sao Paulo (Brazil)

Published in SPIE Proceedings Vol. 4950:
Lasers in Dentistry IX
Peter Rechmann; Daniel Fried; Thomas Hennig, Editor(s)

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