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Proceedings Paper

Er:YAG laser evaluation of smear layer removal from flattened root canals submitted to rotary instrumentation
Author(s): Fabio Heredia Seixas; Aldo Brugnera; Ricardo Gariba Silva; Alexandre Capelli; Danilo Mathias Zanello Guerisoli; Jesus Djalma Pecora
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Paper Abstract

This study evaluated smear layer removal of 40 mesio-distal flattened root canals after rotary instrumentation. Teeth were divided into 4 goups: Group 1: 2.5% sodium hypochlorite was used as an irrigating solution; Group 2: instrumented as Group 1 followed by Er:YAG laser irradiation (140mJ input/10Hz, withdrawn at 2mm/s from the apical to the cervical region touching the buccal wall; the procedure was then repeated for the lingual wall); Group 3: instrumented as Group 1 and followed by Er:YAG laser irradiation (250mJ input/10Hz, in the same way as described for Group 2) and Group 4: instrumented as Group 1 and alternated with 17% EDTA. Teeth were then split longitudinally and prepared for examination under the scanning electron microscope. Scores from 1 to 4 were given to the fotomicrographs by three independent evaluators, and these data were submitted to statistical analysis. Teeth where alternated 17% EDTA was used (Group 4) showed less amount of smear layer, followed by the group irradiated with 250mJ input/10Hz (Group 3), the group irradiated with 140mJ input/10Hz(Group 2) and the group where only sodium hypochlorite was used (Group 1). The apical third presented more smear layer than the middle third (p<00.1)

Paper Details

Date Published: 3 July 2003
PDF: 9 pages
Proc. SPIE 4950, Lasers in Dentistry IX, (3 July 2003); doi: 10.1117/12.476632
Show Author Affiliations
Fabio Heredia Seixas, Univ. de Sao Paulo (Brazil)
Aldo Brugnera, Univ. de Sao Paulo (Brazil)
Ricardo Gariba Silva, Univ. de Sao Paulo (Brazil)
Alexandre Capelli, Univ. de Sao Paulo (Brazil)
Danilo Mathias Zanello Guerisoli, Univ. de Sao Paulo (Brazil)
Jesus Djalma Pecora, Univ. de Sao Paulo (Brazil)


Published in SPIE Proceedings Vol. 4950:
Lasers in Dentistry IX
Peter Rechmann; Daniel Fried; Thomas Hennig, Editor(s)

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