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Proceedings Paper

Improved beam quality due to current profiling in a broad-area semiconductor laser
Author(s): John A. Houlihan; Vincent Voignier; James R. O'Callaghan; Guanhong Wu; Guillaume Huyet; John Gerard McInerney; Brian Corbett
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Paper Abstract

We describe the different mechanisms to generate waves in the transverse section of lasers. Our analysis, based on the Maxwell-Bloch equations, is compared to recent experimental results.

Paper Details

Date Published: 11 March 2003
PDF: 9 pages
Proc. SPIE 4947, Laser Diodes, Optoelectronic Devices, and Heterogenous Integration, (11 March 2003); doi: 10.1117/12.476265
Show Author Affiliations
John A. Houlihan, National Univ. of Ireland/Cork (Ireland)
Vincent Voignier, National Univ. of Ireland/Cork (Ireland)
James R. O'Callaghan, National Univ. of Ireland/Cork (Ireland)
Guanhong Wu, National Univ. of Ireland/Cork (Ireland)
Guillaume Huyet, National Univ. of Ireland/Cork (Ireland)
John Gerard McInerney, Novalux, Inc. (United States)
Brian Corbett, National Microelectronics Research Ctr. (Ireland)


Published in SPIE Proceedings Vol. 4947:
Laser Diodes, Optoelectronic Devices, and Heterogenous Integration

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