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Proceedings Paper

Scanning total internal reflection fluorescence microscopy and its applications
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Paper Abstract

In this paper, we explore the multiphoton excitation capabilities of the scanning total internal reflection fluorescence microscopy (STIRFM) using a focused ring-beam illumination and a high numerical-aperture objective (NA = 1.65). The evanescent field produced by the STIRFM is focused laterally, producing a small excitation volume that can effectively induce non-linear optical process. The theoretical simulation of the focal spot produced in STIRFM geometry shows that the focused evanescent field is split into two peaks due to the strong enhancement of longitudinal polarization component at the focus of a high numerical-aperture objective. Experimental images of two-photon excited CdSe quantum dot nanocrystals show the characteristic split focal spot.

Paper Details

Date Published: 14 November 2002
PDF: 9 pages
Proc. SPIE 4937, Biomedical Applications of Micro- and Nanoengineering, (14 November 2002); doi: 10.1117/12.476038
Show Author Affiliations
James Won Min Chon, Swinburne Univ. of Technology (Australia)
Min Gu, Swinburne Univ. of Technology (Australia)


Published in SPIE Proceedings Vol. 4937:
Biomedical Applications of Micro- and Nanoengineering
Dan V. Nicolau, Editor(s)

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