Share Email Print
cover

Proceedings Paper

Thermal reliability studies of optoelectronic components
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

For optical networks, the operating life of optoelectronic components is expected to be over 20 years. Network designers therefore require components, which have been reliability tested in accordance with assured protocols, such as Telcordia Generic Reliability Assurance Practices (BellCore). In this paper, we report on the development of a system for thermal reliability studies of optoelectronic devices. The system incorporates an environmental test chamber programmed to provide differing temperature environments in the range (-180° to 300° C) as well as constant bias current or voltage to the device udner test. Case studies for preliminary screenign and temperature cycling tests on a wide range of novel active and passive devices fabricated at NMRC for short-haul networks markets are assessed and reported using this system.

Paper Details

Date Published: 27 August 2003
PDF: 10 pages
Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); doi: 10.1117/12.476005
Show Author Affiliations
Padraig J. Hughes, National Microelectronics Research Ctr. (Ireland)
Ger Healy, National Microelectronics Research Ctr. (Ireland)
Xavier Llinares, National Microelectronics Research Ctr. (Ireland)
Mahbub Akhter, National Microelectronics Research Ctr. (Ireland)
J. Justice, National Microelectronics Research Ctr. (Ireland)
Shane O'Brien, National Microelectronics Research Ctr. (Ireland)
John A. Alderman, National Microelectronics Research Ctr. (Ireland)
Gabriel M. Crean, National Microelectronics Research Ctr. (Ireland)


Published in SPIE Proceedings Vol. 4876:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Vincent Toal; Norman Douglas McMillan; Gerard M. O'Connor; Eon O'Mongain; Austin F. Duke; John F. Donegan; James A. McLaughlin; Brian D. MacCraith; Werner J. Blau, Editor(s)

© SPIE. Terms of Use
Back to Top