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Proceedings Paper

Temperature-dependent spectral ellipsometry: a powerful technique for thin film investigations
Author(s): Alexandr Deineka; Petr Pokorny; Lubomir Jastrabik; Gunnar Suchaneck; Gerald Gerlach
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Paper Abstract

In this work, determination of the refractive index profile and the optical gap E02 of PbZr1-XTiO3 thin films is described. Measurements were performed with the J. A Woollam spectral ellipsometer working on rotate analyzer mode. The temperature dependence of optical constants was obtained with a specially designed heating device.

Paper Details

Date Published: 22 July 2002
PDF: 6 pages
Proc. SPIE 4888, First International Workshop on Classical and Quantum Interference, (22 July 2002); doi: 10.1117/12.475877
Show Author Affiliations
Alexandr Deineka, Institute of Physics (Czech Republic)
Petr Pokorny, Institute of Physics (Czech Republic)
Lubomir Jastrabik, Institute of Physics (Czech Republic)
Gunnar Suchaneck, Technische Univ. Dresden (Germany)
Gerald Gerlach, Technische Univ. Dresden (Germany)

Published in SPIE Proceedings Vol. 4888:
First International Workshop on Classical and Quantum Interference
Jan Perina; Miroslav Hrabovsky; Jaromir Krepelka, Editor(s)

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