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Proceedings Paper

Temperature-dependent spectral ellipsometry: a powerful technique for thin film investigations
Author(s): Alexandr Deineka; Petr Pokorny; Lubomir Jastrabik; Gunnar Suchaneck; Gerald Gerlach
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Paper Details

Date Published: 22 July 2002
PDF: 6 pages
Proc. SPIE 4888, First International Workshop on Classical and Quantum Interference, (22 July 2002); doi: 10.1117/12.475877
Show Author Affiliations
Alexandr Deineka, Institute of Physics (Czech Republic)
Petr Pokorny, Institute of Physics (Czech Republic)
Lubomir Jastrabik, Institute of Physics (Czech Republic)
Gunnar Suchaneck, Technische Univ. Dresden (Germany)
Gerald Gerlach, Technische Univ. Dresden (Germany)

Published in SPIE Proceedings Vol. 4888:
First International Workshop on Classical and Quantum Interference

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