Share Email Print
cover

Proceedings Paper

Robust methodology for state-of-the-art embedded SRAM bitcell design
Author(s): Mark J. Craig; John S. Petersen; Joshua Lund; David J. Gerold; Nien-Po Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A design and verification methodology of advanced SRAM bitcell design is described. Dense bitcells, drawn for embedded SRAM memory applications, are drawn and simulated for cell functionality and stability. After first-pass design, lithography correction is determined using analytical and iterative simulation routines. Analytical corrections are tailored to comprehend not only specific tool and material platforms associated with the process technology, but are also optimized to account for process integration issues arising from mask layer to mask layer interactions. Lithography process windows are modeled though simulations based on specific stepper illumination scheme, and material systems. Process integration windows are modeled through overlay of simulated patterns while taking into account process control limits of misalignment and critical dimension. Comparison of simulated to electrical bitcell results are discussed and manufacturability considerations are addressed through electrical responses of bitcell-specific diagnostic test structures.

Paper Details

Date Published: 12 July 2002
PDF: 10 pages
Proc. SPIE 4692, Design, Process Integration, and Characterization for Microelectronics, (12 July 2002); doi: 10.1117/12.475696
Show Author Affiliations
Mark J. Craig, TestChip Technologies, Inc. (United States)
John S. Petersen, Petersen Advanced Lithography, Inc. (United States)
Joshua Lund, TestChip Technologies, Inc. (United States)
David J. Gerold, Petersen Advanced Lithography, Inc. (United States)
Nien-Po Chen, TestChip Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 4692:
Design, Process Integration, and Characterization for Microelectronics
Alexander Starikov; Alexander Starikov; Kenneth W. Tobin, Editor(s)

© SPIE. Terms of Use
Back to Top