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Proceedings Paper

Mesh-restorable networks with complete dual failure restorability and with selectively enhanced dual-failure restorability properties
Author(s): Matthieu Clouqueur; Wayne D. Grover
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Paper Abstract

We consider extensions of the most common mesh-restorable network capacity design formulation that enhance the dual-failure restorability of the designs. A significant finding is that while design for complete dual-failure restorability can require triple the spare capacity, dual failure restorability can be provided for a fairly large set of priority paths with little or no more spare capacity than required for single-failure restorability. As a reference case we first study the capacity needs under complete dual-failure restorability. This shows extremely high capacity penalties to support 100% dual-failure restorability. A second design model allows a user to specify a total capacity budget limit and obtain the highest average dual-failure restorability possible for that investment limit. A third design strategy supports multiple-restorability service class definitions at minimum total cost. Restorability can range from best-efforts-only on any failure to an assurance of complete single and dual-failure restorability, on a per-demand basis. This work shows how to economically support an added service class in the upward quality direction: assured dual failure survivability. This lets a network operator tailor the investment in capacity to provide ultra-high availability on a selective basis, while avoiding the very high investment required for complete dual-failure restorability for all.

Paper Details

Date Published: 3 July 2002
PDF: 12 pages
Proc. SPIE 4874, OptiComm 2002: Optical Networking and Communications, (3 July 2002); doi: 10.1117/12.475288
Show Author Affiliations
Matthieu Clouqueur, TRLabs. and Univ. of Alberta (Canada)
Wayne D. Grover, TRLabs. and Univ. of Alberta (Canada)

Published in SPIE Proceedings Vol. 4874:
OptiComm 2002: Optical Networking and Communications
Nasir Ghani; Krishna M. Sivalingam, Editor(s)

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