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Proceedings Paper

Two-dimensional wavelet mapping techniques for damage detection in structural systems
Author(s): Bruno Amizic; Venkat Amaravadi; Vittal S. Rao; Mark M. Derriso
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Paper Abstract

Application of the wavelet transforms on the measured vibration data provides a new tool for the damage detection analysis of the two-dimensional structural systems. In this paper, a novel two-dimensional wavelet mapping technique for damage detection based on the wavelet transforms and residual mode shapes are proposed. After vibration data was collected, wavelet de-noising shrinkage was performed in order to reduce measurement noise. By performing wavelet decomposition of the residuals of mode shapes and by taking only detail coefficients, wavelet energy maps are constructed for all decomposition levels. The orthogonal property of the wavelet transforms has bee utilized to correlate energy at decomposition levels with the measured vibrational energy. After wavelet maps of interest are determined, they are mapped on top of each other to figure out damaged areas of the two-dimensional structural systems. The energy segmentation procedure is performed by using minimum homogeneity and uncertainty based thresholding methods. It has been shown that the proposed method can clearly locate the multiple damage locations on the two- dimensional structures. This method requires few sampling points, robust and independent of the type of damage or the material damaged. The proposed method is applied to detect multiple damage locations on a two-dimensional plate. The results are very satisfactory.

Paper Details

Date Published: 10 July 2002
PDF: 12 pages
Proc. SPIE 4693, Smart Structures and Materials 2002: Modeling, Signal Processing, and Control, (10 July 2002); doi: 10.1117/12.475224
Show Author Affiliations
Bruno Amizic, Univ. of Missouri/Rolla (United States)
Venkat Amaravadi, Univ. of Missouri/Rolla (United States)
Vittal S. Rao, Univ. of Missouri/Rolla (United States)
Mark M. Derriso, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4693:
Smart Structures and Materials 2002: Modeling, Signal Processing, and Control
Vittal S. Rao, Editor(s)

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