Share Email Print
cover

Proceedings Paper

Pulsed electron-beam testing of optical surfaces
Author(s): Brian W. Murray; Edward A. Johnson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Rapid pulsed low energy electron bean irradiation of optical surfaces has proved to be a cost effective technique to test for radiation hardness and/or optical film adhesion. A rapid pulse (60 ns 130 ns) of electrons generates strong thermomechanical shock waves in the target surface to a depth of several micrometers. Spire''s pulsed electron beam sources (SPIPULSETh 300 and SPIPULSE 5000) are contaminantfree up to a fluence of 1. 0 cal/cm2 so that precise artifactfree optical scatter (e. g. bidirectional reflectance distribution function (BRDF)) measurements can be made before and after irradiation. Fluence reproducibility from shot to shot is 5 thus allowing direct comparisons of radiation responses of different samples or different irradiation sites to be made. Pulsed ebeams have been successfully applied to conductive and nonconductive optical surfaces such as metal and SiC mirrors optical baffles and ceramic optical coatings. A simple model is presented to demonstrate that radiationinduced conductivity (RIC) occurs during intense electron bombardment of any material. For alumina a time constant for the discharge of any residual charge build up that might occur during electron bombardment is estimated to be 30 picoseconds. For the ebeam radiation pulse lengths and fluence levels considered here alumina behaves as a conductive material. Several experimental examples are given including measurements of ebeam induced material blowoff for alumina. 1 .

Paper Details

Date Published: 1 January 1991
PDF: 23 pages
Proc. SPIE 1330, Optical Surfaces Resistant to Severe Environments, (1 January 1991); doi: 10.1117/12.47511
Show Author Affiliations
Brian W. Murray, Spire Corp. (United States)
Edward A. Johnson, Spire Corp. (United States)


Published in SPIE Proceedings Vol. 1330:
Optical Surfaces Resistant to Severe Environments
Solomon Musikant, Editor(s)

© SPIE. Terms of Use
Back to Top