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Proceedings Paper

Holographic characterization of fulgide-doped polymer film
Author(s): Christophe Lafond; Michel Bolte; Roger A. Lessard
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Paper Abstract

Dynamic holographic recording was performed on two fulgides (A540 and A670)/Doped films. Maximum diffraction efficiency of 7% and 6% has been achieved on A540 and A670 doped PEPC/PS films. The effects of the matrix, writing intensity and film thickness on diffraction efficiency were studied. Holographic fatigue resistance in polymer matrix and epoxy resin has been investigated. It was found that holographic fatigue of fulgide doped in epoxy resin is closed to zero at least after 40 Write-Read-Erase cycles (WRE).

Paper Details

Date Published: 17 February 2003
PDF: 7 pages
Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.474839
Show Author Affiliations
Christophe Lafond, COPL/Univ. Laval and Univ. Blaise Pascal (Canada)
Michel Bolte, Univ. Blaise Pascal (France)
Roger A. Lessard, Univ. Laval (Canada)

Published in SPIE Proceedings Vol. 4833:
Applications of Photonic Technology 5
Roger A. Lessard; George A. Lampropoulos; Gregory W. Schinn, Editor(s)

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